We Have Been Selected for the Tokyo Metropolitan Government's Foreign Patent Application Cost Subsidy.
We are pleased to report that seeDNA Inc. has been selected for the "Foreign Patent Application Cost Subsidy" offered by the Tokyo Metropolitan Government.
Patent Name
Genetic Analysis Method Capable of Performing Two or More Types of Tests
Patent Number
Patent No. 7331325
Encouraged by this achievement, we will continue to advance our research and development, pursuing accuracy and reliability in our testing to meet the needs of our customers.